Information technologies and artificial intelligence in metrology – new opportunities and application prospects
Keywords:
metrology, artificial intelligence, automation, machine learning, neural networks and deep learning algorithmsAbstract
The article discusses the use of advanced information technologies and artificial intelligence to automate measurement processes in metrology
References
1. Stepashkina A.S. Numerical methods and machine learning in metrology: textbook. manual / A. S. Stepashkina. – St. Petersburg: GUAP, 2021. – 44 p.
2. Donchenko S.I. Ensuring the uniformity of measurements in the process of digital transformation of the economy.–Almanac of Modern Metrology, FSUE "VNIIFTRI" (Mendeleevo), 2018, No. 16, pp.7-9.
3. D.M. Okhunov, M.H. Okhunov, M.U. Akbarova. A general methodology for evaluating and selecting components of automated systems. - CAD and modeling in modern electronics: a collection of scientific papers of the III International scientific and practical conference. Bryansk, 2019, pp. 54-58.
4. Matyakubova P.M., Kuluyev R.R. Industry 4.0 in the modern direction of metrology development. – Academy. 2019. – No. 3 (42). pp. 16-20.
5. Dilshod Okhunov, Mamatjon Okhunov, Mukaddas Akbarova. Method of calculation of system reliability on the basis of construction of the logical function of the system. E3S Web of Conferences 139, (2019)/ RSES 2019.
